Recently, at an international photovoltaic technology exchange event, technology experts, manufacturers, R&D professionals, equipment and material suppliers, as well as policy and market stakeholders ...

The Chinese manufacturer said it developed a new circuit-model–based method to accurately detect hot-spot risks in TOPCon back-contact modules, overcoming limitations of the IEC 61215 approach caused ...

‘We’re seeing that manufacturers have tried to remove materials, remove costs from those modules, to cut their losses, and that presents reliability risks,’ says Tristan Erion-Lorico. Image: Kiwa PVEL ...