Semiconductor Engineering

Mission-Critical Devices Drive System-Level Test Expansion

System-level testing is becoming essential for testing complex and increasingly heterogeneous chips, driven by rising demand for reliable parts in safety- and mission-critical applications. More and ...
Computer Weekly

LLM series - Tricentis: Continuous testing for gen-AI systems

The latest trends in software development from the Computer Weekly Application Developer Network. This is a guest post for the Computer Weekly Developer Network written by David Colwell in his ...
National Academies of Sciences%2c Engineering%2c and Medicine

Test and Evaluation Challenges in Artificial Intelligence-Enabled Systems for the Department of the Air Force

An AI-enabled system is a computer system that uses AI techniques to perform tasks that typically require advanced deductive or inductive tasks based on collected data of all types. These tasks ...
EDN

System-level test’s expanding role in producing complex chips

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...